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Dimensional metrology

Dimensional surface metrology

Underpinning the core traceability infrastructure for dimensional surface metrology in the UK

The performance and lifetime of many manufactured devices relies upon the precise control over the surface and sub-surface characteristics of its component parts, along with an understanding of how these characteristics relate to the function of each part within the whole device.

We are performing fundamental research to develop:

  • New traceable non-contact surface measurement techniques based on optical interferometry and X-ray computed tomography
  • Next generation primary level instrumentation linking industry to the SI metre
  • Advanced methods and algorithms to determine areal surface topography from raw measurement signals and calculate statistical surface parameters
  • Fundamental theory, practical calibration tools and methods for determining the metrological characteristics of instruments
  • Techniques and good practice for the correlation of functional performance with surface characteristics for process optimisation and control
  • Harmonised software tools to support consistent traceability for industry

We also provide expert consultancy for surface metrology challenges and develop bespoke solutions for process control problems in industry.

Case study

Measuring large-scale, fine-feature printed electronics

Article

Lead researcher

Daniel O'Connor

Senior research scientist

Work with us

Our research and measurement solutions support innovation and product development. We work with companies to deliver business advantage and commercial success.
Contact our Customer Services team on +44 20 8943 7070