NPL provides a one-stop service for the characterisation of the form and texture of surfaces through an extensive range of facilities. NPL-designed instruments, such as the Areal Instrument, Metrological Atomic Force Microscope (MAFM) and NanoSurf IV, provide the highest level of accuracy. In addition to these unique capabilities, an extensive range of commercial instruments, including a Taylor Hobson scanning white light interferometer, an Alicona InfiniteFocus microscope and Olympus LEXT confocal microscope, is available to support our customers.
To assist customers with worldwide acceptability of their own measurements, NPL delivers traceable calibrations of artefacts, such as pitch and height standards. These measurements are based on the purpose-built Metrological Atomic Force Microscope (MAFM) and NanoSurf IV instruments.
The key features of the MAFM are:
The key features of NanoSurf IV are:
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Our research and measurement solutions support innovation and product development. We work with companies to deliver business advantage and commercial success. Contact our Customer Services team on +44 20 8943 7070