Surface chemical analysis

Providing accurate measurements of surface and thin film chemistry to support advanced manufacturing

As the world-leading measurement institute in surface chemical analysis, we provide ultimate confidence and traceability in the measurement of surfaces and coatings. We support manufacturers and companies by providing consultancies, collaborative projects and measurements in many areas, including:

• Thin films and coatings
• Semiconductors and microelectronics
• Organic light emitting diodes and organic photovoltaics
• Pharmaceutical products, drug delivery and biomedical coatings
• Catalysis and corrosion
• Electrode surfaces
• Adhesion and wetting
• Biosensors
• Fabrics and fibres
• Contaminant and defect identification and location

We offer consultancy and measurements for:

• Identification of surface chemistry
• Depth  distribution
• 3D imaging of chemical species
• Real-time monitoring of molecular attachment at surfaces
• Analysis of topographic materials

Available methods include:

Atomic Force Microscopy (AFM), Auger Electron Spectroscopy (AES), Contact Angle Analysis, Quartz Crystal Microbalance (QCM), Raman Spectroscopy and Imaging, Scanning Electron Microscopy (SEM), Secondary Ion Mass Spectrometry (SIMS), Specific Surface Area (SSA), Spectroscopic Ellipsometry (SE), X-ray Photoelectron Spectroscopy (XPS), Ultraviolet Photoelectron Spectroscopy (UPS).

Don’t see what you are looking for? Our diverse skill set enables us to provide bespoke solutions. Please contact us to discuss your requirements.

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Find out more about NPL’s research on Surface engineering

Find out more about NPL’s research on Surface technology