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The Innovation Showcase – 18th March
A unique opportunity for investors and industry to access public sector science and technology innovation

All good practice guides

The use of focussed ion beam microscopy for 3D material characterisation GPG141

The purpose of this guide is to assist users to better understand the capabilities of a FIB-SEM for acquiring two and three dimensional microstructural information for most samples.

The purpose of this guide is to assist users to better understand the capabilities of
a FIB-SEM for acquiring two and three dimensional microstructural information for
most samples.


21 Dec 2016
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