The purpose of this guide is to assist users to better understand the capabilities of
a FIB-SEM for acquiring two and three dimensional microstructural information for
most samples.
21 Dec 2016
pdf
Our research and measurement solutions support innovation and product development. We work with companies to deliver business advantage and commercial success.
Contact our Customer Services team on +44 20 8943 7070
We use necessary cookies to make our site work. We'd also like to set optional analytics cookies to help us improve it. We won't set optional cookies unless you enable them.
Necessary cookies enable core functionality such as security, network management, and accessibility. We do not use cookies for marketing purposes.
We utilise Google Analytics cookies to help us to improve our website by collecting information on how it's used.
Find out more
