A comprehensive Physical Property Measurement System (PPMS) underpinning the characterisation of future electronic and magnetic devices. With fast cool down times and stable magnetic field ramping, measurement time can be fully utilised reducing the cost to customers. From industry and SME’s to academia, the PPMS is a versatile tool for detailed characterisation of bulk samples, micro and nanofabricated devices, as well as nanoparticles, for developing future quantum and nanoelectronics technologies.
The DynaCool PPMS’s flexible design combines many features in one instrument, including magnetometry and electrical transport measurements as well as ferromagnetic resonance spectroscopy. The system can work in a wide range of magnetic fields (up to 9 Tesla) and temperatures down to 1.8K with no need for liquid cryogens (cryogen-free) resulting in significantly reduced running costs compared with traditional wet cryogenic systems.
Vibrating Sample Magnetometer (VSM)
The VSM option enables measurement of a sample's magnetic moment as a function of temperature or magnetic field.
AC susceptibility
The AC measurement system utilises a mutual induction-based technique to determine a sample's dynamic (AC) susceptibility.
AC resistance
The electrical transport option enables AC electrical transport measurements of samples using a 4-probe lead configuration, suitable for all ranges of samples, but especially useful for looking at resistive samples, or those where pulsed current measurements could be utilised such as when studying memristors.
DC resistance
The PPMS can measure DC resistance on up to three channels using a standard puck. This option highlights the efficiency of this system, with data for full temperature and field sweeps of three samples taken simultaneously, reducing the time cost even further.
Broadband FMR spectroscopy utilising the NanOsc CryoFMR-40 allows for dynamic property measurements up to 40 GHz. FMR over such a wide frequency range enables the extraction a variety of magnetic parameters, several which are traditionally inaccessible by static measurement techniques, as well as extracting parameters which can be correlated with those derived from static measurements. From FMR we can extract:
All of these are crucial in developing materials for integration into next-generation low loss electronics.