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Our services include:
Raman and infrared (FTIR) spectroscopy: structural and chemical analysis
X-ray photoelectron spectroscopy (XPS): surface chemical composition
Ultraviolet photoelectron spectroscopy (UPS): material workfunction
Time-of-flight secondary ion mass spectrometry (TOF-SIMS): chemical depth profiling
Contact angle measurement: hydrophobicity
Spectroscopic ellipsometry: film thickness and optical properties
Atomic force microscopy (AFM): topography
Conductive AFM (C-AFM): nanoscale current response
SEM with energy/wavelength-dispersive X-ray spectroscopy (EDX and WDX)
Field-emission SEM: high-resolution images of nanoscale features
Electron back-scatter diffraction (EBSD)
Optical and confocal (3D) microscopy and white-light interferometry
Don’t see what you are looking for? Our diverse skill set enables us to provide a bespoke service. Please contact us to discuss your requirements for electrochemical tests, measurements or models.
Our research and measurement solutions support innovation and product development. We work with companies to deliver business advantage and commercial success. Contact our Customer Services team on +44 20 8943 7070