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Energy storage

Chemical, mechanical and surface characterisation

Understand your devices and materials  

Our services include:

  • Raman and infrared (FTIR) spectroscopy: structural and chemical analysis

  • X-ray photoelectron spectroscopy (XPS): surface chemical composition

  • Ultraviolet photoelectron spectroscopy (UPS): material workfunction

  • Time-of-flight secondary ion mass spectrometry (TOF-SIMS): chemical depth profiling

  • Contact angle measurement: hydrophobicity

  • Spectroscopic ellipsometry: film thickness and optical properties

  • Atomic force microscopy (AFM): topography

  • Conductive AFM (C-AFM): nanoscale current response

  • SEM with energy/wavelength-dispersive X-ray spectroscopy (EDX and WDX)

  • Field-emission SEM: high-resolution images of nanoscale features

  • Electron back-scatter diffraction (EBSD)

  • Optical and confocal (3D) microscopy and white-light interferometry

Don’t see what you are looking for? Our diverse skill set enables us to provide a bespoke service. Please contact us to discuss your requirements for electrochemical tests, measurements or models.

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Work with us

Our research and measurement solutions support innovation and product development. We work with companies to deliver business advantage and commercial success.
Contact our Customer Services team on +44 20 8943 7070