Nanoscale characterisation of electronic materials and devices

Nanoscale characterisation of electronic materials and devices

The performance of many emerging electronic materials and devices is critically dependent on nanoscale structure-function relationships. NPL's Electronic & magnetic materials group has unique nanocharacterisation facilities using advanced modes of optical spectroscopy and scanning probe microscopy.

Advanced Scanning Probe Microscopy (SPM) facility

• AIST Combiscope SPM 
• N₂ glovebox for low O₂ and low H₂O
• Electrical connections to tip and/or sample
• Laser excitation (532 nm, 633 nm, 785 nm) from ‘top’, ‘bottom’ or ‘side’ of the sample
• Photoluminescence/Raman spectroscopy
• Temperature controlled stage (LN₂ to 600 °C)
• Electrical connections for in situ studies

SPM modes available

• Surface topography
• Scanning Kelvin Probe Microscopy (SKPM, time‑resolved SKPM)
• (photo-)conductive AFM (pc-AFM, c-AFM)
• Tip-enhanced Optical Spectroscopy (TERS, TEPL)
• Other ‘custom modes’ also possible

Don’t see what you are looking for? Our diverse skill set enables us to provide bespoke solutions. Please contact us to discuss your requirements.

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