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Electromagnetic materials

Nanoscale characterisation of electronic materials and devices

Nanoscale characterisation of electronic materials and devices

The performance of many emerging electronic materials and devices is critically dependent on nanoscale structure-function relationships. NPL's Electronic & magnetic materials group has unique nanocharacterisation facilities using advanced modes of optical spectroscopy and scanning probe microscopy.


Advanced Scanning Probe Microscopy (SPM) facility

  • AIST Combiscope SPM 
  • N2 glovebox for low O2 and low H2O
  • Electrical connections to tip and/or sample
  • Laser excitation (532 nm, 633 nm, 785 nm) from ‘top’, ‘bottom’ or ‘side’ of the sample
  • Photoluminescence/Raman spectroscopy
  • Temperature controlled stage (LN2 to 600 °C)
  • Electrical connections for in situ studies

SPM modes available

  • Surface topography
  • Scanning Kelvin Probe Microscopy (SKPM, time‑resolved SKPM)
  • (photo-)conductive AFM (pc-AFM, c-AFM)
  • Tip-enhanced Optical Spectroscopy (TERS, TEPL)
  • Other ‘custom modes’ also possible

Don’t see what you are looking for? Our diverse skill set enables us to provide bespoke solutions. Please contact us to discuss your requirements.

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