Dr. Olthoff is NIST’s first Chief Metrologist, and as such serves as the primary representative both nationally and internationally of NIST’s role as the national metrology institute of the United States. Prior to becoming NIST Chief Metrologist, Dr. Olthoff was the Associate Director for Laboratory Programs where he provided direction and operational guidance for all of NIST's scientific and technical laboratory programs, and served as principal deputy to the Under Secretary of Commerce for Standards and Technology and NIST Director. Dr. Olthoff has filled many high-profile positions representing NIST and the United States within the international metrology community. Currently, Dr. Olthoff is one of the vice-presidents of the International Committee on Weights and Measures (CIPM), and has held several leadership positions within SIM.
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