Daniel joined NPL in 2014 and now leads our dimensional surface metrology work. He comes from an academic background in the field of plasmonics and nanooptics where he attained the degree of PhD in Physics at the Queen’s University of Belfast (QUB). He has held postdoctoral research positions at QUB and King’s College London (KCL) and was also a visiting Professor at the University of North Florida where he ran a course on Optics and several labs on Experimental Physics.
He is a Fellow of the Royal Microscopical Society, and Member of the Institute of Physics, the European Microscopy Society, the European Society for Precision Engineering and Nanotechnology, and a Sustaining Member of the American Society for Precision Engineering.
Throughout his career, Daniel has published several high impact journal articles. His research interests at NPL are in the design and implementation of novel sensor systems and advanced data processing techniques for traceable non-contact critical dimension metrology, areal surface topography measurement and defect detection, focussing on applications in the Advanced Manufacturing sector.