Andrew is a principal scientist in the Dimensional Metrology Group leading the dimensional nanometrology work. His research focuses on X-ray and optical interferometry, nanopositioning and quantitative scanning probe microscopy.
He collaborates with industrial and academic partners, both nationally and internationally together with other national metrology laboratories to address dimensional nanometrology challenges.
Andrew Yacoot obtained is PhD in X-ray crystallography from Royal Holloway, University of London and then undertook post-doctoral research in X-ray microscopy at King’s College London before joining NPL in 1991.
His initial NPL research was in the field of x-ray interferometry as a tool for dimensional nanometrology. He was seconded to PTB, the German National Metrology Institute where he continued this work and developed an atomic force microscope for the study of tip sample interactions. He has participated in numerous European collaborative projects across the area of dimensional nanometrology covering X-ray and optical interferometry, nanopositioning, metrological atomic force microscopy (AFM) and metrological high-speed AFM. He was instrumental in getting the lattice parameter of silicon adopted as a secondary realisation of the metre for dimensional nanometrology.
Andrew is a Fellow of the Institute of Physics and a Chartered Physicist. He is Editor in Chief for the Institute of Physics Journal Measurement Science and Technology. He chairs the International Bureau of Weights and Measures’ Consultative Committee for Length’s Working Group on Dimensional Nanometrology.
Current interests:
Selected publications:
[1] Klapetek P, Necas D, Heaps E, Sauvet B, Klapetek V, Valtr, M Korpelainen V and Yacoot A 2024 Stitching accuracy in large area scanning probe microscopy Meas. Sci. Technol. 35 125026 (12pp)
[2] Lewis AJ, Yacoot A, Lancaster AJ and Milton M A 2022 A Digital framework for realising the SI – a proposal for the metre Metrologia 59 044004
[3] Bridges A, Yacoot A, Kissinger T and Tatam R 2022 Multiple intensity reference interferometry for the correction of sub-fringe displacement non-linearities Meas. Sci. Technol. 33 025201)
[4] Schödel R, Yacoot A and Lewis A 2021 The new Mise en Pratique for the metre—a review of approaches for the practical realization of traceable length metrology from 10−11 m to 1013 m Metrologia 58 5 052002 (21pp)
[5] Yacoot A, Bosse, B and Dixson R 2020 The lattice parameter of silicon; a secondary realisation of the metre 2020 Meas. Sci. Technol. 31 121001
[6] Heaps E, Yacoot A, Dongmo H, Picco L, Payton O D, Russell-Pavier F and Petr Klapetek P 2020 Bringing real-time traceability to high speed atomic force microscopy Meas. Sci. Technol. 31 074005 (11pp) [4] Alcock S G, Yacoot A, Ince Rand Patel H 2022 Generating and measuring pico-radian angles Metrologia 59 064002 15pp
[7] Yacoot A, Lawn M, Korpelainen V, Dongmo H, O’Neill J, Hermann J, Miles J, Coleman V, Seppa J, and Lassila A 2020 How accurate is your atomic force microscope? A comparison of dimensional measurements made using different AFMs Microscopy and Analysis 34 (6):S4-S9
[8] Yacoot A, Klapetek P, Valtr M, Grolich P, Dongmo H, Lazzerini G M and Bridges A 2019 Design and performance of a test rig for evaluation of nanopositioning stages Meas. Sci. Technol. 30 035002 (10pp)
[9] Klapetek P, A Yacoot A, Grolich P, Valtr M and Nečas D 2017 Gwyscan: a library to support non-equidistant scanning probe microscope measurements Meas. Sci. Technol. 28 034015 (11pp)
[10] Yacoot A and Kuetgens U 2012 Sub-atomic dimensional metrology: developments in the control of x-ray interferometers Meas. Sci. Technol. 23 074003 (7pp)