Characterising materials for printed electronics, nanoelectronics and additively-manufactured devices
Emerging electronics make use of novel materials and manufacturing processes to create new electronic devices that can be easily integrated into a wide range of products. From large area flexible electronics, to wearables and implantable electronic devices, it is crucial to understand the impact of processing on material properties, device performance and reliability.
Transistors, sensors, energy harvesting devices, photovoltaics and light emitting diodes can all be manufactured in novel ways and easily integrated into different products, supporting the advanced manufacturing sector. Materials systems, including organic and hybrid semiconductors, nanomaterials and 2D materials, are used as the active layers in these electronic components.
We carry out world-leading metrology research into emerging electronic technologies. We work with large companies, SMEs, universities and R&D centres to support materials and product development. We offer a unique combination of world-leading measurement and modelling capability with considerable know-how acquired through the successful delivery of numerous projects.
We are focused on overcoming metrology barriers for the emerging electronics community to increase confidence in the products, accelerate market entry and increase competitiveness. Our work is centred on four broad themes:
Enabling new technologies – Understanding the relationship between processing, structure and performance; advanced multiscale characterisation methods (from nm to μm to cm); advanced data analysis and modelling methods.
Improving reliability – Advanced in situ testing facilities; long-term and accelerated testing; degradation mechanism elucidation; failure analysis; seal and barrier layer characterisation.
Supporting high quality advanced manufacturing – Pre-process, in-process, post-process characterisation; non-destructive testing; spatially-resolved measurement methods; advanced data analysis and modelling methods.
Standardisation of testing and characterisation – Development of best practice guides and standards through VAMAS, BSI, IPC and IEC.