In the rapidly evolving landscape of semiconductor electronics, the development of integrated circuits is pivotal for the communications, automotive, defence, and space industries. End users continually demand more precise and reliable measurements with increasingly stringent specifications. However, the challenge lies in achieving high frequency on-wafer measurements that meet these requirements. As technology advances, the need for accurate on-wafer measurements becomes paramount to ensure the performance and reliability of semiconductor integrated circuits.
Addressing the challenges of on-wafer measurements, the National Physical Laboratory (NPL) has pioneered a ground-breaking solution. NPL's on-wafer S-parameter measurement capability has been developed to reach frequencies up to an impressive 750 GHz. This innovative technology enables the accurate and consistent measurement of integrated circuits, particularly those based on compound semiconductors. This capability serves as a crucial tool for both industry and academia, offering unparalleled precision in the evaluation of semiconductor electronics.
The on-wafer measurement solution developed by NPL represents a significant leap forward in the field. It not only meets the current demands for more accurate measurements but also sets the stage for future advancements in semiconductor technology. This breakthrough empowers researchers, engineers, and manufacturers to explore new frontiers in the design and fabrication of integrated circuits, especially those that operate at higher frequencies.
The impact of NPL's on-wafer measurement solution is multifaceted and extends beyond the laboratory. NPL has authored and co-authored two Best Practice Guides on on-wafer measurement, establishing itself as a knowledge leader in the field. Furthermore, we have played a pivotal role in the development of the world's first on-wafer measurement standard, IEEE Standards P2822, setting a benchmark for industry.
In practical terms, we have actively contributed to overcoming on-wafer measurement challenges faced by industries in the UK and Europe. Through various projects, including two Innovate UK projects, three EMPIR projects, three Measurement for Recovery (M4R) projects, one Analysis for Innovators (A4I) project, and one EPM project, NPL has provided valuable expertise and support. By collaborating with industry partners, NPL has facilitated advancements in on-wafer measurements, contributing to the overall growth and innovation within the semiconductor electronics sector. The impact is not only evident in scientific achievements but also in the tangible benefits realised by industries that rely on precise on-wafer measurements for their semiconductor devices.
Collaborating with the National Physical Laboratory (NPL) enabled Filtronic to continue to execute our road map for higher frequency mmWave. NPL provided reliable, accurate measurements of Filtronic's mmWave prototype circuits, which helped to accelerate the development of new product lines. By partnering with experts like NPL, Filtronic can continue to push the performance boundaries of what is possible for mmWave technology.
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