This event is locally organised by the Brazilian Physical Society (SBF) and supported by NPL.
Registration is now open at: sec.sbfisica.org.br/eventos/extras/iuvsta101/sys
The workshop will have talks from invited experts and delegates are welcome to submit abstracts for oral or poster contributions. Abstract submission.
Secondary ion mass spectrometry (SIMS) is at an exciting juncture with innovation in ion beams and high-resolution mass analysers with higher than ever confidence in molecule identification. The high-resolution data provides new challenges for advanced data analytics. The 101st IUVSTA workshop will provide a unique opportunity to engage the community on three themes:
- Novel mass analysers (design & applications)
- Novel ion beams (design & applications)
- Machine learning & artificial intelligence.
The workshop will include have oral presentations, panel discussion and interactive sessions to encourage collaboration and exchange. The number of delegates is limited, and the venue has been selected to provide an ideal environment for discussion.