Keith is a Senior Research Scientist in the Surface Technology group. His research is focussed on structural characterisation of advanced materials, including graphene and related 2D materials (GR2Ms). His aim to develop reliable measurement methods to accelerate the adoption of advanced materials as part of a net-zero carbon future.
Keith has been active in carbon nanomaterial research since 2009, working with both carbon nanotubes and graphene. He received his PhD from the University of Cambridge, before joining the Advanced Materials division at Thomas Swan and Co. Ltd. In 2012 he moved to Trinity College Dublin to work as a researcher-in-residence for Thomas Swan, embedded in the research group of Prof. Jonathan Coleman. He joined NPL in 2016 to develop measurement methods for graphene enhanced composites.
Keith is a Chartered Physicist, and a Member of the Institute of Physics since 2018.
Recent Publications:
- Rahman F K, Paton K R, Hinchliffe B, Minelli C, Pollard A J and Marchesini S, NMR proton relaxation for measuring the relative concentration of nanoparticles in liquids Nanoscale 15, (2023) 18218-23
- Paton K R, Despotelis K, Kumar N, Turner P and Pollard A J, On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets Beilstein Journal of Nanotechnology 14, (2023) 509-21
- Turner P, Paton K R, Legge E J et al., International interlaboratory comparison of Raman spectroscopic analysis of CVD-grown graphene 2D Materials 9, (2022) 035010
Full publication list available on Google Scholar
ORCiD
Areas of Interest:
- Rapid metrology techniques for graphene and related 2D materials
- In-line measurement of advanced materials
- Methods for quantification of chemical functionalisation of graphene
Email Keith Paton