Benjamen Reed obtained his PhD from Aberystwyth University and the DST CDT in 2020 studying the catalytic conversion of diamond and silicon carbide surfaces into epitaxial graphene.
He is currently a Higher Research Scientist in the Surface Technology group and joined NPL in 2018. Ben’s research includes X-ray photoelectron spectroscopy (XPS) metrology, developing standardised procedures of XPS measurement, calibration, and analysis. He also has an active interest in the characterisation of graphene, 2D materials, and energy storage materials with photoelectron techniques.
Benjamen organises and participates in interlaboratory comparisons with the Versailles Project on Advanced Materials and Standards (VAMAS) under the auspices of the Surface Chemical Analysis technical working area (TWA 2). He is a UK expert for ISO/TC 201 (Surface Chemical Analysis) on SC7 (Electron Spectroscopies). He is also a member of the Institute of Physics.
Selected Publications
B. P. Reed, DJH Cant, SJ Spencer et al., Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene, Journal of Vacuum Science & Technology A 38, 063208 (2020).
B. F. Spencer, S. Maniyarasu, B. P. Reed, D. J. H. Cant et al., Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers: A comparison of synchrotron and lab-based (9.25 keV) measurements, Applied Surface Science 541, 148635 (2021).
B. P. Reed, M. E. Bathen, J. W. R. Ash et al., Diamond (111) surface reconstruction and epitaxial graphene interface, Physical Review B 105, 205304 (2022).
Full publication list available on Google Scholar
ORCiD: 0000-0002-7574-5483