Kelvin Probe Force Microscopy (KPFM) is a mode of scanning probe microscopy for measurement of surface potential (or work function) with nanometre-scale spatial resolution. Despite the widespread use of KPFM there are no existing international standards for how to perform these measurements resulting in confusion over definitions and interpretation. The community of practice requires a clear statement of the current state-of-the-art to support correct use of KPFM and further development of the technique. This Good Practice Guide is intended for KPFM users to provide a clear and consistent framework for performing, understanding and interpreting measurements. Many commercial and customised instruments can be used for KPFM measurements using different specific modalities. This guide does not address these differences in detail, nor does it replace technical training on any specific instrument, rather it relates to the basic principles common to all KPFM measurements.
31 Jul 2026
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