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Energy storage

Chemical, mechanical and surface characterisation

Understand your devices and materials  

Our services include:

  • Raman and infrared (FTIR) spectroscopy: structural and chemical analysis

  • X-ray photoelectron spectroscopy (XPS): surface chemical composition

  • Ultraviolet photoelectron spectroscopy (UPS): material workfunction

  • Time-of-flight secondary ion mass spectrometry (TOF-SIMS): chemical depth profiling

  • Contact angle measurement: hydrophobicity

  • Spectroscopic ellipsometry: film thickness and optical properties

  • Atomic force microscopy (AFM): topography

  • Conductive AFM (C-AFM): nanoscale current response

  • SEM with energy/wavelength-dispersive X-ray spectroscopy (EDX and WDX)

  • Field-emission SEM: high-resolution images of nanoscale features

  • Electron back-scatter diffraction (EBSD)

  • Optical and confocal (3D) microscopy and white-light interferometry

Don’t see what you are looking for? Our diverse skill set enables us to provide a bespoke service. Please contact us to discuss your requirements for electrochemical tests, measurements or models.

Contact us

Work with us

Our research and measurement solutions support innovation and product development. We work with companies to deliver business advantage and commercial success.
Contact our Customer Services team on +44 20 8943 7070