More than 20 years experience in dynamic SIMS, NanoSIMS and other high spatial resolution microanalytical methods such as FESEM/EDS and dual beam FIB/SEM. Earned his doctorate degree at the University of the Saarland in Materials Science while working in Prof. Herbert Gleiter’s group studying bulk nanophase materials. He began his SIMS career by leading the SIMS lab at the Canadian Materials Technology Laboratory and went on from there to work with NanoSIMS at Harvard University and University of Manchester.
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