Current Interests

• Metrology of graphene and graphene nanodevices
• Characterisation of graphene
• Development of SECM-SICM for industrial applications

Biography

Andrew Pollard received his MSci in Physics from the University of Nottingham in 2005 and finished his PhD with Professor Peter Beton from the University of Nottingham's Nanoscience group in 2010. Andrew's previous work includes development of a combined AFM-STM system in UHV, production of graphene monolayers on transition metal surfaces in UHV and subsequent STM surface studies, which has led to several peer-reviewed scientific publications in 2009. Having joined the Nanoanalysis group in November 2009, Andrew is currently interested in using surface and nanoanalysis techniques for the characterisation of graphene surfaces and the development of combined Scanning Electrochemical (SECM) and Scanning Ion-Conductance (SICM) Microscopy.

Selected Publications

1. Multifunctional Nanoprobes for Nanoscale Chemical Imaging and Localized Chemical Delivery at Surfaces and Interfaces
   Y. Takahashi, A. I. Shevchuk, P. Novak, Y. Zhang, N. Ebejer, J. V. Macpherson, P. R. Unwin, A. J. Pollard, D. Roy, C. A. Clifford, H. Shiku, T. Matsue, D. Klenerman, and Y. E. Korchev
   Angew. Chem. Int. Ed., 50, pages 9638-9642 (2011)
2. Supramolecular assemblies formed on an epitaxial Graphene superstructure
   A. J. Pollard, E. W. Perkins, N. A. Smith, A. Saywell, G. Goretzki, A. G. Phillips, S. P. Argent, H. Sachdev, F. Müller, S. Hüfner,, S. Gsell, M. Fischer, M. Schreck, J. Osterwalder, T. Greber, S. Berner, N. R. Champness, P. H. Beton
   Angew. Chem. Int. Ed., 49, pages 1794-1799 (2010)
3. Formation of monolayer Graphene by annealing sacrificial Nickel thin films
   A. J. Pollard, R. R. Nair, S. N. Sabki, C. R. Staddon, L. M. A. Perdigao, C. H. Hsu, J. M. Garfitt, S. Gangopadhyay, H. F. Gleeson, A. K. Geim and P. H. Beton
   J. Phys. Chem. C, 112 (39), pages 15439-15448 (2009)
4. Dynamic scanning probe microscopy of adsorbed molecules on Graphite
   N. Berdunov, A. J. Pollard, and P. H. Beton
   Appl. Phys. Lett., 94, 043110 (2009)
5. How does Graphene grow? Easy access to well-ordered Graphene films
   F. Müller, H. Sachdev, S. Hüfner, A. J. Pollard, E. W. Perkins, J. C. Russell, P. H. Beton, S. Gsell, M. Fischer, M. Schreck, B. Stritzker
   Small, 5 (20), pages 2291-2296 (2009)
6. Development of a Novel Combined Scanning Electrochemical Microscope (SECM) and Scanning Ion-Conductance Microscope (SICM) Probe for Soft Sample Imaging
   A. J. Pollard, N. Faruqui, M. Shaw, C. A. Clifford, Y. Takahashi, Y. E. Korchev, N. Ebejer, J. V. Macpherson, P. R. Unwin, D. Roy
   MRS Proceedings, 1422, mrsf11-1422-qq07-04 doi:10.1557/opl.2012.489 (2012)

ResearcherID page

Contact details

Email: andrew.pollard@npl.co.uk
Tel: 020 8943 6266