X-ray computed tomography (XCT), enabled by advances in graphics processing technology and imaging science, has found increasing used in industrial applications over the last decade. XCT generates three-dimensional volumetric images of objects allowing the inspection of both internal and external features. Driven by the need for quality control of increasingly complex three-dimensional engineering components, notably for additively manufacturing, XCT systems have been developed specifically for the purpose of dimensional metrology.
In this seminar NPL will be joined by representatives from Zeiss and researchers from the University of Manchester to explore XCT for dimensional metrology. We will identify trends in technology adoption, compare XCT with other inspection modalities such as laser line scanners and contact probe coordinate measurement machines, provide examples of dimensional XCT in action and discuss validation methodologies to ensure the quality of the results.