National Physical Laboratory

Improving single-crystal orientation determination for advanced nickel-based alloys.

Author(s):

Clay, K*, Jackson, J D*, Quested, P N, Morrell, R

Source:
Measurement Good Practice Guide No. 112, April 2009
ISSN:
1368-6550
ISBN:
NPL Doc. Ref:
PDB: 5355 | DDB: 3010
Document Type:
Guide
DOI:

Note: An asterisk after an author's name indicates a non-NPL author.

Abstract:

This Good Practice Guide describes the determination of single-crystal orientation measurements for single-crystal nickel-base castings by back and side-reflection X-ray diffraction (Laue). These measurements check the quality of the castings against specifications set by the OEMs for the foundries.For quality control three parameters are determined:1. The angle between a reference direction in the component, defining the preferred direction of solidification, and the closest <100> direction. (q).2. Less commonly, the angle between a second reference direction in the plane perpendicular to the original reference direction (a) and/or a <001> direction (k).3. For single crystals with more than one grain a measurement of the misorientation or disorientation between adjacent grains (R).The guide contains information about the definition of orientation parameters; principles of back-reflection and side-reflection Laue systems; calibration standards; system alignment; calibration; validation and uncertainty of measurements with a final section on making the measurements.The definition of primary angles is based upon European practice but a comparison with two definition conventions used in the USA is included.

Download Free Electronic Copy

Please log in or register to access this functionality.

Further Information

General information about NPL publications and details to contact the British Library for other published papers can be found on the NPL Publications Homepage.