National Physical Laboratory

2009

  1. "Analysis of the Interface and its Position in C60+ SIMS Depth Profiling", F M Green, A G Shard, I S Gilmore, M P Seah. Analytical Chemistry, 81, 75-79 (2009)
  2. "Developing repeatable measurements for reliable analysis of molecules at surfaces using DESI", F M Green, P Stokes, C Hopley, M P Seah, I S Gilmore, G O'Connor. Analytical Chemistry, 81, 2286-2293 (2009)
  3. "Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy", M Munz. Scanning Probe Microscopy in Nanoscience and Nanotechnology, Ed. Bharat Bhushan, Springer Berlin Heidelberg, 259-321 (2009)
  4. "Novel methodology for estimating the enhancement factor for tip-enhanced Raman spectroscopy", D Roy, J Wang, C Williams. Journal of Applied Physics, 105, 013530 (2009)
  5. "Quantitative XPS depth profiling of codeine loaded poly(L-lactic acid) films using a coronene ion sputter source", A Rafati, M C Davies, A G Shard, S Hutton, G Mishra, M R Alexander. Journal of Controlled Release, 138(1), 40-44 (2009)
  6. "Organic depth profiling of a binary system: the compositional effect on secondary ion yield and a model for charge transfer during secondary ion emission ", A G Shard, A Rafati, R Ogaki, J L S Lee, M C Davies, S Hutton, G Mishra, M R Alexander. Journal of Physical Chemistry B, 113(34), 11574-11582 (2009)
  7. "Cluster primary ion sputtering: secondary ion intensities in static SIMS of organic materials", M P Seah, F M Green and I S Gilmore. Journal of Physical Chemistry C, 114(12), 5351-5359 (2009)
  8. "Does hydrogen change the fullerene like structure in CNx thin films?", D Roy, M Chhowalla, N Hellgren, G Amaratunga. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 27(5), 1227-1230 (2009)
  9. "Simplified drift characterization in scanning probe microscopes using a simple two-point method", C A Clifford and M P Seah. Measurement Science and Technology, 20, 095103 (2009)
  10. "Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods", C A Clifford and M P Seah. Measurement Science and Technology, 20, 125501 (2009)
  11. "Sample preparation protocols for realization of reproducible characterization of single-wall carbon nanotubes", J E Decker, A R HightWalker, K Bosnick, C A Clifford, L Dai, J Fagan, S Hooker, Z J Jakubek, C Kingston, J Makar, E Mansfield, M T Postek, B Simard, R Sturgeon, S Wise, A E Vladar, L Yang and R Zeisler. Metrologia, 46, 682-692 (2009)
  12. "Nanoindentation measurement of Young's modulus for compliant layers on stiffer substrates including the effect of Poisson's ratios", C A Clifford and M P Seah. Nanotechnology, 20, 145708 (2009)
  13. "G-SIMS: relative effectiveness of different monatomic primary ion source combinations", M P Seah, I S Gilmore and F M Green. Rapid Communications in Mass Spectrometry, 23, 599-602 (2009)
  14. "Stoichiometric MgB2 layers produced by multi-energy implantation of boron into magnesium", Z Werner, W Szymczyk, J Piekoszewski, M P Seah, R Ratajczak, L Nowicki, M Barlak and E Richter. Surface and Coating Technology, 203, 2712-2716 (2009)
  15. "The development of standards and guides for multivariate analysis in surface chemical analysis ", J L S Lee, B J Tyler, M S Wagner, I S Gilmore and M P Seah. Surface and Interface Analysis, 41, 76-78 (2009)
  16. "XPS Topofactors: determining overlayer thickness on particles and fibres", A G Shard, J Wang, S J Spencer. Surface and Interface Analysis, 41(7), 541-548 (2009)
  17. "Multivariate image analysis strategies for ToF-SIMS images with topography", J L S Lee, I S Gilmore and I W Fletcher. Surface and Interface Analysis, 41(8), 653-665 (2009)
  18. "Ultra-thin SiO2 on Si IX: absolute measurements of the amount of silicon oxide as a thickness of SiO2 on Si", M P Seah, W E S Unger, HaiWang, W Jordaan, Th Gross, J A Dura, DaeWon Moon, P Totarong, M Krumrey, R Hauert and Mo Zhiqiang. Surface and Interface Analysis, 41(5), 430-439 (2009)
  19. "Angular accuracy and the comparison of two methods for determining the surface normal in a Kratos Axis Ultra X-ray photoelectron spectrometer", M P Seah and S J Spencer. Surface and Interface Analysis, 41(12-13), 960-965 (2009)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk