National Physical Laboratory

2008

  1. "Topography and field effects in the quantitative analysis of conductive surfaces using TOF-SIMS", J L S Lee, I S Gilmore, I W Fletcher and M P Seah. Applied Surface Science, 255, 1560-1563 (2008)
  2. "Artifacts in the sputtering of inorganics by C60^n+", J L S Lee, I S Gilmore and M P Seah. Applied Surface Science, 255, 934-937 (2008)
  3. "G-SIMS and SMILES fragmentation pathways for identification of complex molecules, amino acids and peptides", F M Green, I S Gilmore and M P Seah. Applied Surface Science, 255, 852-855 (2008)
  4. "C60 ion sputtering of layered organic materials", A G Shard, F M Green and I S Gilmore. Applied Surface Science, 255, 962-965 (2008)
  5. "On the applicability of XPS for quantitative total organic and elemental carbon analysis of airborne particulate matter", R J J Gilham, S J Spencer, D Butterfield, M P Seah, P G Quincey. Atmospheric Environment, 42, 3888-3891 (2008)
  6. "Synthesis and Raman spectroscopic characterisation of carbon nanoscrolls", D Roy, E Angeles-Tactay, R J C Brown, S J Spencer, T Fry, T A Dunton, T Young, M J T Milton. Chemical Physics Letters, 465, 254–257 (2008)
  7. "Analysis of metastable ions in the ToF-SIMS spectra of polymers", A G Shard and I S Gilmore. International Journal of Mass Spectrometry, 269, 85-94 (2008)
  8. "Identification of complex molecules at surfaces: G-SIMS and SMILES fragmentation pathways", F M Green, E J Dell, I S Gilmore and M P Seah. International Journal of Mass Spectrometry, 272, 38-47 (2008)
  9. "On the nature of the multi-zone interphase of a thermoset/thermoplastic composite–an analysis employing dynamic-mechanical thermal analysis and nanoindentation", M Munz. Journal of Adhesion, 84, 445-482 (2008)
  10. "Simplifying the delivery of melanocytes and keratinocytes for the treatment of vitiligo using a chemically defined carrier dressing", P C Eves, M A Bullett, D Haddow, A J Beck, C Layton, L Way, A G Shard, D J Gawkrodger, S Mac Neil. Journal of Investigative Dermatology, 128(6), 1554-1564 (2008)
  11. "Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS", A G Shard, F M Green, P J Brewer, M P Seah and I S Gilmore. Journal of Physical Chemistry B, 112 , 2596-2605 (2008)
  12. "Sputtering, cluster primary ions and static SIMS", M P Seah. Journal of Surface Analysis, 14, 305-311 (2008)
  13. "Development of a standards base for static SIMS", I S Gilmore . Journal of Surface Analysis , 14(4), 376-382 (2008)
  14. "Cluster primary ions: spikes, sputtering yields, secondary ion yields and inter-relationships for secondary molecular ions for static SIMS", M P Seah. Journal of Vacuum Science and Technology A, 26, 660-667 (2008)
  15. "Fabrication of gold tips suitable for tip-enhanced Raman spectroscopy", D Roy, C Williams. Journal of Vacuum Science and Technology B, 26(5), 1761 (2008)
  16. "CCQM-K32 key comparison and P84 pilot study amount of silicon oxide as a thickness of SiO2 on Si", M P Seah. Metrologia (Technical Supplement), 45, 08013 (2008)
  17. "Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support", M Munz, D C Cox and P J Cumpson. Physica Status Solidi A, 205(6), 1424-1428 (2008)
  18. "Modelling of nanoindentation for compliant layers on stiffer substrates using finite element analysis", C A Clifford, M P Seah. Materials Research Society Proceedings, 1025E, 1025-B08-07 (2008)
  19. "Imaging G-SIMS: A novel bismuth-manganese source emitter", F M Green, I S Gilmore, M P Seah, F Kollmer, E Niehus. Rapid Communications in Mass Spectrometry, 22, 2602-2608 (2008)
  20. "Cluster ion beam profiling of organics by SIMS - Does sodium affect the molecular ion intensity at interfaces", F M Green, I S Gilmore, M P Seah. Rapid Communications in Mass Spectrometry, 22, 4178-4182 (2008)
  21. "The application of multivariate data analysis techniques in surface analysis", J L S Lee and I S Gilmore. Surface Analysis – The Principal Techniques, 2nd Edition, Eds J C Vickerman and I S Gilmore, Wiley, 563-612 (2008)
  22. "Quantification and methodology issues in multivariate analysis of ToF-SIMS data for mixed organic systems", J L S Lee, I S Gilmore and M P Seah. Surface and Interface Analysis, 40, 1-14 (2008)
  23. "A comparison of the static SIMS and G-SIMS spectra of biodegradable homo-polyesters", R Ogaki, F M Green, S Li, M Vert, M R Alexander, I S Gilmore and M C Davies. Surface and Interface Analysis, 40(8), 12002-1208 (2008)
  24. "Extracting information on the surface monomer unit distribution of PLGA by ToF-SIMS", R Ogaki, A G Shard, S Li, M Vert, S Luk, M R Alexander, I S Gilmore and M C Davies. Surface and Interface Analysis, 40(8), 1168-1175 (2008)
  25. "Summary of ISO/TC 201 Standard: XXXIII, ISO 18115:2001/Amd. 2:2007 - Surface Chemical Analysis - Vocabulary - Amendment 2", M P Seah. Surface and Interface Analysis, 40, 1500-1502 (2008)
  26. "A practical method to fabricate gold substrates for surface-enhanced Raman spectroscopy", R Tantra, R J C Brown, M J T Milton and D Gohil. Applied Spectroscopy, 62 (9), 992-1000 (2008)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk