National Physical Laboratory

2007

  1. "Directly writing with nanoparticles at the nanoscale using dip-pen nanolithography", D Roy, M Munz, P Colombi, S Bhattacharyya, J-P Salvetat, P J Cumpson and M-L Saboungi. Applied Surface Science, 254(5), 1394-1398 (2007)
  2. "Self-assembled lamellar structures with functionalized single wall carbon nanotubes", S Bhattacharyya, D Roy, J-P Salvetat, V Heresanu, P Launois and M-L Saboungi. Chemical Communnications, 41, 4248-4250 (2007)
  3. "Comment on "Identification of background in CMA" [J. Surf. Anal. 14, 95 (2007)]", M P Seah. Journal of Surface Analysis, 14, 169 (2007)
  4. "Comparison of the accuracies of two methods for the determination of the surface normal for x-ray photoelectron spectroscopy", M P Seah. Metrologia, 44, 242-245 (2007)
  5. "Electronic structure of pristine and potassium-doped Y@C82 metallofullerene", C Ton-That, V R Dhanak, H Shinohara, J S Bendall, M E Welland and A G Shard. Physical Review B, 73 (20), 205406 (2007)
  6. "Cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometry", M P Seah. Surface and Interface Analysis, 39, 634 (2007)
  7. "Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials", A G Shard, P J Brewer, F M Green and I S Gilmore. Surface and Interface Analysis, 39, 294-298 (2007)
  8. "Ultrathin SiO2 on Si VIII. Accuracy of method, linearity and attenuation lengths for XPS", Kyung Joong Kim and M P Seah. Surface and Interface Analysis, 39(6), 512-518 (2007)
  9. "Study of the end group contribution to ToF-SIMS and G-SIMS spectra of poly (lactic acid) using deuterium labelling", R Ogaki, F M Green, I S Gilmore, A G Shard, S Luk, M R Alexander and M C Davies. Surface and Interface Analysis, 39(11), 852-859 (2007)
  10. "Cluster ion sputtering: molecular ion yield relationships for different cluster primary ions in static SIMS of organic materials", M P Seah. Surface and Interface Analysis, 39, 890-897 (2007)
  11. "Accurate measurement of sputtered depth for ion sputtering rates and yields: the mesh replica method", M P Seah, J Geller and M Suzuki. Surface and Interface Analysis, 39 , 69-78 (2007)
  12. "Summary of ISO/TC 201 Standard: XXVIII, ISO 18115:2001/Amd. 1:2006 – Surface Chemical Analysis – Vocabulary – Amendment 1", M P Seah. Surface and Interface Analysis, 39, 367-369 (2007)
  13. "Summary of ISO/TC 201 Standard: XXIII, ISO 24236 – Surface Chemical Analysis – Auger electron spectroscopy – Repeatability and constancy of intensity scales", M P Seah. Surface and Interface Analysis, 39, 86-88 (2007)
  14. "Summary of ISO/TC 201 Standard: XXIV, ISO 24237 – Surface Chemical Analysis – X-ray photoelectron spectroscopy – Repeatability and constancy of intensity scales", M P Seah. Surface and Interface Analysis, 39, 370-372 (2007)
  15. "Static ToF-SIMS - a VAMAS interlaboratory study part II - accuracy of the mass scale and G-SIMS compatability", I S Gilmore, F M Green and M P Seah. Surface and Interface Analysis, 39, 817 (2007)
  16. "The detection of airborne carbon nanotubes in relation to toxicology and workplace safety", R Tantra, D Gohil, P J Cumpson. Nanotoxicology, 1(4), 251-265 (2007)
  17. "Strategy to improve the reproducibility of colloidal SERS", R Tantra R J C Brown, M J T Milton. Journal of Raman Spectroscopy, 38 (11), 1469-1479 (2007)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk