National Physical Laboratory

2005

  1. "Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation", C A Clifford and M P Seah. Applied Surface Science, 252, 1915-1933 (2005)
  2. "Microelectromechanical device for lateral force calibration in the atomic force microscope: Lateral electrical nanobalance", P J Cumpson, J Hedley and C A Clifford . Journal of Vacuum Science and Technology B, 23(5), 1992-1997 (2005)
  3. "Accurate thickness measurements in thin films with surface analysis", M P Seah. Journal of Surface Analysis, 12, 70-77 (2005)
  4. "The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis", C A Clifford and M P Seah. Nanotechnology, 16, 1666-1680 (2005)
  5. "An accurate semi-empirical equation for sputtering yields, II: for neon, argon and xenon ions", M P Seah. Nuclear Instruments and Methods B, 229, 348-358 (2005)
  6. "Erratum to 'An accurate semi-empirical equation for sputtering yields, II: for neon, argon and xenon ions' [Nuclear instruments and methods B 229 348-358 (2005)]", M P Seah. Nuclear Instruments and Methods B, 239, 286-287 (2005)
  7. "Metrology at the nano scale", B Sheridan, P J Cumpson and M Bailey. Physics World, August 2005, 37-40 (2005)
  8. "Ultrathin SiO2 on Si, VI: evaluation of uncertainties in thickness measurement using XPS", M P Seah. Surface and Interface Analysis, 37, 300-309 (2005)
  9. "An accurate semi-empirical equation for sputtering yields, I: for argon ions", M P Seah, C A Clifford, F M Green and I S Gilmore. Surface and Interface Analysis, 37, 444-458 (2005)
  10. "Static TOF-SIMS - a VAMAS interlaboratory study. Part I. Repeatability and reproducibilty of spectra", I S Gilmore, M P Seah and F M Green. Surface and Interface Analysis, 37, 651-672 (2005)
  11. "Ultrathin SiO2 on Si, VII: angular accuracy in XPS and an accurate attenuation length", M P Seah and S J Spencer. Surface and Interface Analysis, 37, 731-736 (2005)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk