National Physical Laboratory

2004

  1. "Advances in measurement: neutron reflectometry for highly accurate nanometer metrology ", J A Dura and M P Seah . Annual Report of Accomplishments and Opportunities of the NIST Centre for Neutron Research, , 46 (2004)
  2. "Organic molecule characterization - G-SIMS ", I S Gilmore and M P Seah . Applied Surface Science, 231-232, 224-229 (2004)
  3. "Microelectromechanical system device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m ", P J Cumpson, J Hedley, C A Clifford, X Chen and S Allen . Journal of Vacuum Science and Technology, 22(4), 1444-1449 (2004)
  4. "Intercomparison of silicon dioxide thickness measurements made by multiple techniques - the route to accuracy ", M P Seah . Journal of Vacuum Science and Technology A, 22, 1564-1571 (2004)
  5. "Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration ", P J Cumpson, C A Clifford and J Hedley . Measurement Science and Technology, 15, 1337-1346 (2004)
  6. "An optical 'workstation' for characterisation and modification of MEMS ", J Hedley, J S Burdess, A J Harris, B J Gallacher, C J McNeil, P J Cumpson and S Enderling . Proceedings of SPIE, 5458, 244-252 (2004)
  7. "Critical review of the current status of thickness measurements for ultra-thin SiO2 on Si: part V, results of a CCQM pilot study ", M P Seah, S J Spencer, F Bensebaa, I Vickridge, H Danzebrink, M Krumrey, T Gross, W Oesterle, E Wendler, B Rheinländer, Y Azuma, I Kojima, N Suzuki, M Suzuki, S Tanuma, D W Moon, H J Lee, Hyun Mo Cho, H Y Chen, A T S Wee, T Osipowicz, J S Pan, W A Jordaan, R Hauert, U Klotz, C van der Marel, M Verheijen, Y Tamminga, C Jeynes, P Bailey, S Biswas, U Falke, N V Nguyen, D Chandler-Horowitz, J R Ehrstein, D Muller and J A Dura . Surface and Interface Analysis, 36, 1269-1303 (2004)
  8. "Summary of ISO/TC 201 Standard: XXII, ISO 22048:2004 - Surface chemical analysis - information format for static secondary-ion mass spectrometry ", I S Gilmore, M P Seah and A Henderson . Surface and Interface Analysis, 36, 1642-1644 (2004)
  9. "Summary of ISO/TC 201 Standard: XXI, ISO 21270:2004 - Surface chemical analysis - x-ray photoelectron and auger electron spectrometers - linearity of intensity scale ", M P Seah . Surface and Interface Analysis, 36, 1645-1646 (2004)
  10. "Nanoanalytical measurements for the determination of protein orientation at surfaces. ", C M Halliwell, F Green, I S Gilmore, P J Cumpson and J A Davies. The Analyst, 129, 1166-1170 (2004)
  11. "Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs ", P J Cumpson, P Zhdan and J Hedley . Ultramicroscopy, 100, 241-251 (2004)
  12. "G-SIMS - Direct analysis of organic surfaces ", I S Gilmore . VAM Bulletin, 31, 17 - 21 (2004)
  13. "Nano-analysis using atomic force microscopy ", C A Clifford, P J Cumpson and M P Seah . VAM Bulletin, 31, 21 - 25 (2004)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk