National Physical Laboratory

2003

  1. "G-SIMS of crystallisable organics ", I S Gilmore and M P Seah . Applied Surface Science, 203-204, 551-555 (2003)
  2. "Investigating the difficulty of eliminating flood gun damage in TOF-SIMS ", I S Gilmore and M P Seah . Applied Surface Science, 203-204, 600-604 (2003)
  3. "Ultra-thin SiO2 on Si: I, quantifying and removing carbonaceous contamination ", M P Seah and S J Spencer . Journal of Vacuum Science and Technology A, 21(2), 345-352 (2003)
  4. "Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI ", P J Cumpson and J Hedley . Nanotechnology, 14, 1279-1288 (2003)
  5. "Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration ", P J Cumpson, J Hedley and P Zhdan . Nanotechnology, 14, 918-924 (2003)
  6. "Chapter 7, Instrument calibration for AES and XPS ", M P Seah . Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy, Eds D Briggs and J T Grant, SurfaceSpectra Ltd/I M Publications, 167-189 (2003)
  7. "Chapter 13, Quantification in AES and XPS ", M P Seah . Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy, Eds D Briggs and J T Grant, SurfaceSpectra Ltd/I M Publications , 345-375 (2003)
  8. "Summary of ISO standard: XI ISO 17974:2002 surface chemical analysis - high resolution auger electron spectrometers - calibration of energy scales for elemental and chemical state analysis ", M P Seah . Surface and Interface Analysis, 35 (3), 327-328 (2003)
  9. "Summary of ISO Standard: XII ISO 17973:2002 surface chemical analysis - medium resolution auger electron spectrometers - calibration of energy scales for elemental analysis ", M P Seah . Surface and Interface Analysis, 35 (3), 329-330 (2003)
  10. "Ultra-thin SiO2 on Si: IV, thickness linearity and intensity measurement in XPS ", M P Seah and S J Spencer . Surface and Interface Analysis, 35 (6), 515-524 (2003)
  11. "Quantification issues in ToF-SSIMS and AFM co-analysis in two-phase systems, exampled by a polymer blend ", I S Gilmore, M P Seah and J E Johnstone . Surface and Interface Analysis, 35 (11), 888-896 (2003)
  12. "Degradation of poly(vinyl chloride) and nitrocellulose in XPS ", M P Seah and S J Spencer . Surface and Interface Analysis, 35 (11), 906-913 (2003)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk