National Physical Laboratory

2002

  1. "Electron flood gun damage in the analysis of polymers and organics in time of flight SIMS ", I S Gilmore and M P Seah . Applied Surface Science 187 89-100 (2002) , 187 (1-2), 89-100 (2002)
  2. "Quantitative AES and XPS: tests of theory using AES and XPS databases with REELS background subtraction ", M P Seah . Journal of Surface Analysis, 9(3), 275-280 (2002)
  3. "Ultra-thin SiO2 on Si: II, issues in quantification of the oxide thickness ", M P Seah and S J Spencer . Surface and Interface Analysis, 33(8), 640-652 (2002)
  4. "Resolution Parameters for model functions used in surface analysis ", M P Seah . Surface and Interface Analysis, 33 (12), 950-953 (2002)
  5. "Ultra-thin SiO2 on Si: III, mapping the layer thickness efficiently by XPS ", M P Seah and R White . Surface and Interface Analysis, 33(12), 960-963 (2002)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk