National Physical Laboratory

2001

  1. "Quantitative XPS, I: analysis of x-ray photoelectron intensities from elemental data in a digital photoelectron database", M P Seah, I S Gilmore and S J Spencer. Journal of Electron Spectroscopy and Related Phenomena, 120 (1-3), 93-111 (2001)
  2. "Summary of ISO standard: VIII, ISO 18115:2001 - surface chemical analysis - vocabulary ", M P Seah . Surface and Interface Analysis, 31(11), 1048-1049 (2001)
  3. "Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships ", P J Cumpson . Surface and Interface Analysis, 31, 23-34 (2001)
  4. "Summary of ISO/TC 201 standard: VII ISO 15472-2001 - surface chemical analysis - x-ray photoelectron spectrometers - calibration of energy scales ", M P Seah . Surface and Interface Analysis, 31 (8), 721-723 (2001)
  5. "Quantitative AES IX and quantitative XPS II: auger and x-ray photoelectron intensities and sensitivity factors from spectral digital databases re-analysed using a REELS database ", M P Seah, I S Gilmore and S J Spencer . Surface and Interface Analysis, 31(8), 778-795 (2001)
  6. "Simplified equations for correction parameters for elastic scattering effects for Q, b and attenuation lengths in AES and XPS ", M P Seah and I S Gilmore . Surface and Interface Analysis, 31 (8), 835-846 (2001)
  7. "Background subtraction III: the application of REELS data to background removal in AES and XPS ", M P Seah, I S Gilmore and S J Spencer . Surface Science, 471 (1-3), 185-202 (2001)
  8. "Optimisation of operating conditions", I S Gilmore. ToF-SIMS: Surface Analysis by Mass Spectrometry, Eds. J C Vickerman and D Briggs, SurfaceSpectra/IMPublications, 261–283 (2001)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk