National Physical Laboratory

2000

  1. "Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure ", I S Gilmore and M P Seah . Applied Surface Science, 161 (3-4), 465-480 (2000)
  2. "Ion detection efficiency in SIMS: energy, mass and composition dependencies for microchannel plates used in mass spectrometers ", I S Gilmore and M P Seah . International Journal of Mass Spectrometry, 202 (1-3), 217-229 (2000)
  3. "AES of bulk insulators - control and characterisation of the surface charge ", M P Seah and S J Spencer . Journal of Electron Spectroscopy, 109 (3), 291-308 (2000)
  4. "Consistent, combined quantitative AES and XPS digital data bases - convergence of theory and experiment ", M P Seah, I S Gilmore and S J Spencer . Journal of Vacuum Science and Technology A18 1083-1088 (2000) , 18 (4), 1083-1088 (2000)
  5. "Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure ", I S Gilmore, M P Seah and J E Johnstone . Applied Surface Science, 161 (3-4), 465-480 (2000)
  6. "The Thickogram: a method for easy film thickness measurement in XPS ", P J Cumpson . Surface and Interface Analysis, 29, 403-406 (2000)
  7. "A static SIMS Inter-laboratory study ", I S Gilmore and M P Seah . Surface and Interface Analysis, 29 (9), 624-637 (2000)
  8. "Depth resolution in sputter depth profiling - characterisation of a tantalum pentoxide on tantalum certified reference material ", M P Seah, S J Spencer, I S Gilmore and J E Johnstone . Surface and Interface Analysis, 29 (1), 73-81 (2000)
  9. "Sputter-induced cone and filament formation on InP and AFM tip shape determination ", M P Seah, S J Spencer, P J Cumpson and J E Johnstone . Surface and Interface Analysis, 29 (11), 782-790 (2000)
  10. "Background subtraction II: general behaviour of REELS and the tougaard universal cross section in the removal of backgrounds in AES and XPS ", M P Seah, I S Gilmore and S J Spencer . Surface Science 461 1-15 (2000) , 461 (1-3), 1-15 (2000)
  11. "Static SIMS: Towards Unfragmented Mass Spectra - The G-SIMS Procedure", I S Gilmore, M P Seah and J E Johnstone. Secondary Ion Mass Spectrometry, SIMS XII,, Eds A Benninghoven, P Bertrand, H-N Migeon and H W Werner, Elsevier, Amsterdam, 801-804 (2000)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk