National Physical Laboratory

1998

  1. "Static SIMS - a reliable technique: results from an interlaboratory study ", I S Gilmore and M P Seah . ECASIA 97, European Conference on Applications of Surface and Interface Analysis, Eds I Olefjord, L Nyborg and D Briggs, Wiley, Chichester, 1081-1084 (1998)
  2. "Practical analyses of intensities in AES ", M P Seah, I S Gilmore, H E Bishop and G Lorang . ECASIA 97, European Conference on Applications of Surface and Interface Analysis, Eds I Olefjord, L Nyborg and D Briggs, Wiley, Chichester, 801-804 (1998)
  3. "Validation of software for the analysis of peak areas in XPS ", M P Seah and M T Brown . ECASIA 97, European Conference on Applications of Surface and Interface Analysis, Eds I Olefjord, L Nyborg and D Briggs, Wiley, Chichester, 856-859 (1998)
  4. "Estimation of attenuation length for film in thickness measurement in XPS and AES ", P J Cumpson and M P Seah . ECASIA 97, European Conference on Applications of Surface and Interface Analysis, Eds I Olefjord, L Nyborg and D Briggs, Wiley, Chichester, 872-875 (1998)
  5. "Validation and accuracy of software for peak synthesis in XPS ", M P Seah and M T Brown . Journal of Electron Spectroscopy, 95, 71-93 (1998)
  6. "AES: Energy calibration of electron spectrometers IV - a re-evaluation of the reference energies ", M P Seah . Journal of Electron Spectroscopy, 97, 235-241 (1998)
  7. "Static SIMS: an inter-laboratory study ", I S Gilmore and M P Seah . Secondary Ion Mass Spectrometry, SIMS XI, Eds G Gillen, R Lareau, J Bennett and F Stevie, Wiley, Chichester, 999-1002 (1998)
  8. "Calibration of auger and x-ray photoelectron spectrometers for valid analytical measurements ", P J Cumpson, S J Spencer and M P Seah . Spectroscopy Europe, 10, 8-14 (1998)
  9. "XPS: Energy calibration of electron spectrometers, 4 - an assessment of effects for different conditions and of the overall uncertainties ", M P Seah, I S Gilmore and S J Spencer . Surface and Interface Analysis, 26, 617-641 (1998)
  10. "XPS: Binding energy calibration of electron spectrometers 5 - a re-assessment of the reference energies ", M P Seah, I S Gilmore and G Beamson . Surface and Interface Analysis, 26, 642-649 (1998)
  11. "Quantitative AES, V: practical analysis of intensities with detailed examples of metals and their oxides ", M P Seah, I S Gilmore, H E Bishop and G Lorang . Surface and Interface Analysis, 26, 701-722 (1998)
  12. "Quantitative AES, VI: backscattering and backgrounds - an analysis of elemental systematics and corrections of intensity ", M P Seah and I S Gilmore . Surface and Interface Analysis, 26, 723-735 (1998)
  13. "Quantitative AES, VII: the ionisation cross section in AES ", M P Seah and I S Gilmore . Surface and Interface Analysis, 26, 815-824 (1998)
  14. "Quantitative AES, VIII: analysis of auger electron intensities for elemental data in a digital auger database ", M P Seah and I S Gilmore . Surface and Interface Analysis, 26, 908-929 (1998)
Last Updated: 26 Jan 2012
Created: 9 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk