National Physical Laboratory

1995

  1. "Surface chemical analysis and the VAM principles", M P Seah. Analytical Proceedings, 32, 523-524 (1995)
  2. "A system for the intensity calibration of electron spectrometers", M P Seah. Journal of Electron Spectroscopy, 71, 191-204 (1995)
  3. "Angle-resolved XPS and AES - depth resolution limits and a general comparison of properties of depth-profile reconstruction methods", P J Cumpson . Journal of Electron Spectroscopy, 73, 25-52 (1995)
  4. "Work functions and electron spectroscopy", M P Seah . Journal of Surface Analysis, 1, 409-410 (1995)
  5. "Static SIMS: surface charge neutralisation of insulators for highly repeatable spectra when using a quadrupole mass spectrometer", I S Gilmore and M P Seah. Surface and Interface Analysis, 23, 191-203 (1995)
  6. "Fluence, flux, current and current density measurement in faraday cups for surface analysis", I S Gilmore and M P Seah. Surface and Interface Analysis, 23, 248-258 (1995)
  7. "Effective dead time in pulse counting systems", M P Seah. Surface and Interface Analysis, 23, 729-732 (1995)
Last Updated: 26 Jan 2012
Created: 26 Jan 2012

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk