National Physical Laboratory

1990

  1. "Channel electron multipliers: quantitative intensity measurement - efficiency, Gain, linearity and Bias effects", M P Seah. Journal of Electron Spectroscopy, 50, 137-157 (1990)
  2. "Precision, accuracy and uncertainty in quantitative surface analysis by auger electron spectroscopy and x-ray photoelectron spectroscopy", C J Powell and M P Seah. Journal of Vacuum Science and Technology A, 8, 735-763 (1990)
  3. "Quartz-crystal microbalance: radial/polar dependence of mass-sensitivity both on and off the electrodes", P J Cumpson and M P Seah. Measurement Science and Technology, 1, 544-555 (1990)
  4. "Appendix 1, Spectrometer energy Scale calibration", M P Seah and G C Smith. Practical Surface Analysis Volume 1: Auger and X-ray Photoelectron Spectroscopy 2nd Edn, Eds D Briggs and M P Seah, J Wiley, London, 531-540 (1990)
  5. "Chapter 1, A perspective of the analysis of surfaces and interfaces", M P Seah and D Briggs. Practical Surface Analysis Volume 1: Auger and X-ray Photoelectron Spectroscopy 2nd Edn, Eds D Briggs and M P Seah, J Wiley, London, 1-18 (1990)
  6. "Appendix 2, Charge referencing techniques for insulators", M P Seah. Practical Surface Analysis Volume 1: Auger and X-ray Photoelectron Spectroscopy 2nd Edn, Eds D Briggs and M P Seah, J Wiley, London, 541-553 (1990)
  7. "Chapter 5, Quantitative AES and XPS", M P Seah. Practical Surface Analysis Volume 1: Auger and X-ray Photoelectron Spectroscopy 2nd Edn, Eds D Briggs and M P Seah, J Wiley, London, 201-255 (1990)
  8. "Chapter 7, AES in metallurgy", M P Seah. Practical Surface Analysis Volume 1: Auger and X-ray Photoelectron Spectroscopy 2nd Edn, Eds D Briggs and M P Seah, J Wiley, London, 311-356 (1990)
  9. "AES: Energy calibration of electron spectrometers I - an absolute, traceable energy calibration and the provision of atomic reference line energies", M P Seah, G C Smith and M T Anthony. Surface and Interface Analysis, 15, 293-308 (1990)
  10. "AES: Energy Calibration of Electron Spectrometers II - Results of a BCR Interlaboratory Comparison Co-sponsored by the VAMAS SCA TWP", M P Seah and G C Smith. Surface and Interface Analysis, 15, 309-322 (1990)
  11. "Method for the Alignment of Samples and the Attainment of Ultra-high Resolution Depth Profiles in Auger Electron Spectroscopy", C P Hunt and M P Seah. Surface and Interface Analysis, 15, 254-258 (1990)
  12. "Quantitative AES and XPS. Determination of the Electron Spectrometer Transmission Function and the Detector Sensitivity Energy Dependencies for the Production of True Electron Emission Spectra in AES and XPS", M P Seah and G C Smith. Surface and Interface Analysis, 15, 751-766 (1990)
  13. "Quantitative AES: calibration of spectrometers for true spectral measurements - results of a VAMAS round robin and recommendations for acquiring reference data banks", M P Seah and G C Smith. Surface and Interface Analysis, 16, 168-172 (1990)
  14. "Quantitative AES: reducing errors in measured analog spectral intensities through control of the electron detector", M P Seah and G C Smith. Surface and Interface Analysis, 15, 701-704 (1990)
  15. "Standard reference spectra for XPS and AES: their derivation, validation and use", G C Smith and M P Seah  Surface and Interface Analysis, 16, 144-148 (1990)
  16. "VAMAS surface chemical analysis technical working party - an overview of project objectives, progress and the requirements for further work", M P Seah. Surface and Interface Analysis, 16, 135-139 (1990)
  17. "Quantitative AES and XPS: calibration of electron spectrometers for true spectral measurements - VAMAS round robins and parameters for reference spectral data banks", M P Seah and G C Smith. Vacuum, 41, 1601-1604 (1990)
Last Updated: 26 Jan 2012
Created: 11 Aug 2010

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk