Tantalum Pentoxide (Ta₂O₅) depth profile reference material was developed and fabricated by NPL, and is available via IRMM in Brussels.

CRM 261 comprises four 30 nm thickness samples and four 100 nm thickness samples of Ta₂O₅ on Ta, each approximately 10 mm by 5 mm in size. Each set comes with appropriate reports and certificates.

IRMM have online catalogues describing this and other reference materials. To order the material or obtain further information, please contact:

Institute for Research Materials and Measurements
European Commision
Directorate-General Joint Research Centre
Institute for Reference Materials and Measurements
Retieseweg 111
B-2440 Geel
Belgium

Email: jrc-irmm-rm-sales@ec.europa.eu
Tel:- +32 14 571 705
Fax:- +32 14 590 406

Contact

Customer Service tel: +44 20 8943 8637
E-mail: nanoanalysis_enquiries@npl.co.uk