NPL supplies a range of Measurement Services, reference materials, and software, which underpin quantitative surface analysis.

Surface & Nanoanalysis Measurement Services

• DESI Measurement Services
• Drop shape analysis, wettability
• Scanning Probe Microscopy
• Secondary Ion Mass Spectrometry
• Variable Angle Spectroscopic Ellipsometry
• X-ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, Ultraviolet Photoelectron Spectroscopy

Nanoparticle Characterisation Measurement Services

• Characterisation of dry materials
• Characterisation of dispersed materials

Reference materials

• Organic multilayer reference material for depth profiling - OML
• AES and XPS reference materials for use with the intensity calibration software or for calibrating the energy scale
• Tantalum pentoxide reference material for depth profiling

Software

• Intensity calibration software for AES and XPS
• EasyGSIMS - A simple spreadsheet for calculating the G-SIMS spectra
• ARCtick – Software to assist Angle-Resolved XPS depth profiling
• VAMAS eViewer - An emailable viewer for XPS and SIMS spectra in VAMAS standard data transfer format (ISO 14976)
• PC138 - VAMAS format checking software
• Validation of XPS software - NPL provides synthetic XPS data in ISO14976 format files which allow you to validate the peak fitting routines used in your software

Standards and guides

• Practical Chemometrics Guide for analysis of SIMS spectra and images
• Surface chemical analysis vocabulary, as defined in ISO18115:2001

Reference data

• Average matrix relative sensitivity factors for AES and XPS
• Synthetic spectra for validating XPS peak fitting routines
• Sputter yield values for Neon, Argon and Xenon ions

Contact

For more information, please contact: nanoanalysis@npl.co.uk