Products & ServicesWe study the measurement of the physical and chemical properties of surfaces down to the nanoscale, from biological samples to electronic components.
NPL supplies a range of Measurement Services, reference materials, and software, which underpin quantitative surface analysis.
Surface & Nanoanalysis Measurement Services
- DESI Measurement Services
- Drop shape analysis, wettability
- Scanning Probe Microscopy
- Secondary Ion Mass Spectrometry
- Variable Angle Spectroscopic Ellipsometry
- X-ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, Ultraviolet Photoelectron Spectroscopy
Nanoparticle Characterisation Measurement Services
Reference materials
- Organic multilayer reference material for depth profiling - OML
- AES and XPS reference materials for use with the intensity calibration software or for calibrating the energy scale
- Tantalum pentoxide reference material for depth profiling
Software
- Intensity calibration software for AES and XPS
- EasyGSIMS - A simple spreadsheet for calculating the G-SIMS spectra
- ARCtick - Software to assist Angle-Resolved XPS depth profiling
- VAMAS eViewer - An emailable viewer for XPS and SIMS spectra in VAMAS standard data transfer format (ISO 14976)
- PC138 - VAMAS format checking software
- Validation of XPS software - NPL provides synthetic XPS data in ISO14976 format files which allow you to validate the peak fitting routines used in your software
Standards and guides
- Practical Chemometrics Guide for analysis of SIMS spectra and images
- Surface chemical analysis vocabulary, as defined in ISO 18115:2001
Reference data
- Average matrix relative sensitivity factors for AES and XPS
- Synthetic spectra for validating XPS peak fitting routines
- Sputter yield values for Neon, Argon and Xenon ions
Contact
For more information, please contact: nanoanalysis@npl.co.uk