Versailles Project on Advanced Materials and Standards (VAMAS)
VAMAS supports world trade in products dependent on advanced materials technologies, through international collaborative projects aimed at providing the technical basis for harmonised measurements, testing, specifications, and standards. VAMAS covers a wide range of technologies through different Technical Working Areas (TWAs). For surface and nanoanalysis, TWA 2 'Surface chemical analysis' is most relevant and is chaired by Ian Gilmore at NPL. At present there are projects covering static Secondary Ion Mass Spectrometry, organic depth profiling, X-ray Photoelectron Spectroscopy, Angle-Resolved X-ray Photoelectron Spectroscopy, Auger Electron Spectroscopy and X-ray Reflectivity. Future opportunities for studies include, Scanning Probe Microscopy, Desorption Electrospray Ionisation (DESI), Spectroscopic Ellipsometry, multivariate data analysis and imaging Matrix Assisted Laser Desorption Ionisation (MALDI). Please contact Ian Gilmore if you are interested in participating or leading a VAMAS study.
Selected Publications
- Static SIMS - VAMAS Interlaboratory study for Intensity Repeatability, Mass Scale Accuracy and Relative Quantification, F M Green, J L S Lee, I S Gilmore, S J Spencer and M P Seah, Surf. Interface Anal., 42 (2010) 129
- Static ToF-SIMS - A VAMAS Interlaboratory Study Part II - Accuracy of the Mass Scale and G-SIMS Compatibility, I S Gilmore, F M Green and M P Seah, Surf. Interface Anal. 39 (2007) 817
- Static TOF-SIMS - A VAMAS Interlaboratory Study Part I - Repeatability And Reproducibility of Spectra, I S Gilmore. M P Seah and F M Green, Surf. Interface Anal. 37 (2005) 651
- A Static SIMS Interlaboratory Study, I S Gilmore and M P Seah., Surf. Interface Anal. 29 624-637 (2000)
DESI Intensity Repeatability and Constancy
Further information
List of VAMAS interlaboratory studies led by NPL
Software
Data analysis spreadsheet for SIMS repeatability and constancy (ISO 23830)
If you require PDF copies of the publications, please contact us below.
Contact: Ian Gilmore