There are two technical committees (TC) that are relevant to surface and nanoanalysis:

1. TC 201 Surface chemical analysis, which covers terminology, general procedures, data management and treatment, depth profiling, Auger electron spectroscopy, Secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Glow discharge spectroscopy and Scanning probe microscopy. More details about NPL's contribution are given here.
2. TC 229 Nanotechnologies, which covers terminology and nomenclature, measurement and characterization, health, safety and environmental aspects of nanotechnologies and material specifications. NPL has a strong presence in TC 229 with Charles Clifford (UK chair in measurement and characterization), Mark Gee (UK chair for terminology and nomenclature) and Kamal Hossain. Charles Clifford is also the liaison officer between TC 201 and TC 229. NPL led the writing of the first technical specification to be published by TC229 on terminology and definitions for nano-objects.

Further information

List of standards led by NPL for ISO/TC 201 – Surface Chemical Analysis

Current list of standards published in ISO / TC 201

Full list of work items in ISO / TC 201

References

Vocabulary of ~800 terms for Surface Chemical Analysis – ISO

ISO 18115 Vocabulary – A family tree of SPM acronyms, and annotated figures of the design of complex probes and probe assembly

If you require PDF copies of the publications, please contact us below.

Contact: Ian Gilmore or Charles Clifford