Interlaboratory study

Reference

VAMAS Study:
Static SIMS - Linearity of the intensity scale

In preparation

AFM / nanoindentation study of modulus measurement of polymers at the nanoscale

In preparation

VAMAS Study:
Static SIMS - Organic depth profiling by cluster ion beams

Surface and Interface Analysis, in press

Journal of Physical Chemistry B 114 (2) 769-774 (2010)

CCQM Key Comparison:
Thickness of SiO2 on Si, < 10 nm

Surface and Interface Analysis 41 430 (2009)

VAMAS Study:
Static SIMS - Accuracy of the mass scaling and G-SIMS compatibility

Surface and Interface Analysis 39 817 (2007)

VAMAS Study:
Static SIMS - Repeatability and reproducibility of spectra

Surface and Interface Analysis 37 651-672 (2005)

CCQM Pilot Study:
Thickness of SiO2 on Si, < 10 nm

Surface and Interface Analysis 36 1269-1303 (2004)

Journal of Vacuum Science and Technology A 22 1564-1571 (2004)

VAMAS Study:
Static SIMS - Repeatability and reproducibility of spectra

ECASIA 97 Proceedings, Wiley, Chichester (1998), p 1081-1084

SIMS XI Proceedings, Wiley, Chichester (1998) p 999-1002

Surface and Interface Analysis 29 624-637 (2000)

EC Study:
XPS - Accurate intensity calibration of electron spectrometers

Surface and Interface Analysis 20 243-266 (1993)

EC Study:
AES - Alloy steel reference sample to calibrate Auger electron spectrometers for monolayer segregants at grain boundaries

Materials Science and Technology 8 1036-1041 (1992)

EC Study:
AES - Composite reference sample to calibrate Auger electron spectrometers in the differential mode

Materials Science and Technology 8 1036-1041 (1992)

Journal of Electron Spectroscopy 61 173-182 (1993)

EC Study:
AES - Intensity calibration and stability of cylindrical mirror analyser-based Auger electron spectrometers

Surface and Interface Analysis 17 855-874 (1991)

Journal of Electron Spectroscopy 58 345-357 (1992)

EC Study:
AES - Energy calibration of electron spectrometers

Surface and Interface Analysis 15 309-322 (1990)