Nanomechanics with Atomic Force Microscopy
Nanomechanical measurements using Atomic Force Microscopy (AFM) can be used to identify materials at the nanoscale and to determine some of their physical properties. For quantitative results and for single molecule pulling, one needs to determine the spring constant of an AFM cantilever [1]. We are working on improved methods to achieve this and are also leading the standardisation of these techniques via ISO. Utilising the lateral forces in combination with functionalised tips can give chemical information on the surface and can be used to shear nanoparticles or determine the adhesion force of nanoparticles on surfaces [2]. In the field of AFM nanoindentation, we are collaborating with industry on determining the quantitative modulus of homogeneous materials at surfaces and providing guidance on how to determine the nanoscale modulus of compliant nanoscale overlayers on stiff substrates, including a new 10% rule [3]. We are also studying the nanoindentation process of nanoparticles.
Selected Publications
[1] Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods, C A Clifford, M P Seah, Meas. Sci. Technol. 20 (2010) 125501
[2] Force calibration in lateral force microscopy - A review of the experimental methods, M Munz, J. Phys. D 34, 063001, (2010)
[3] Nanoindentation measurement of Young's modulus for compliant layers on stiffer substrates including the effect of Poisson's ratios, Clifford and Seah, Nanotech 20 145708 (2009)
[4] Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation, C A Clifford, M P Seah, App. Surf. Sci., 252 1915. (2005)
If you require PDF copies of the publications, please contact us below.
Contact: Charles Clifford or Martin Munz