(a) Sketch of an AFM tip pushing against a nanoparticle.

(b) Lateral force microscopy (LFM) image of an array of tungsten nanodots, where the nanodots of the inner area have been detached by the scanning AFM tip.

Nano-objects, such as nanoparticles, nanorods or nanotubes, have at least one nano-scale dimension. As a result of the small size, their surface-to-volume ratio is very high and many properties are different from those of their macroscopic counterparts. This allows for numerous applications, ranging from surface functionalisation of commodities, to chemical sensing, to novel materials. Dedicated measurement techniques are required that allow for quantitative characterisation of nano-objects and their properties. In particular, high resolution microscopy techniques are needed that enable the analysis of the size and shape of single nano-objects, in addition to measurement of their physical properties. In the case of AFM, mechanical forces can be applied to single nano-objects. Experiments towards the quantitative measurement of the adhesion strength between nanodots and a support surface have shown that suitable methods for the calibration of lateral forces need to be identified. Another major prerequisite is the availability of AFM tips that are both ultra-sharp and wear-resistant. To address this issue, various carbon nanotube AFM tips were evaluated by imaging a nano-crystalline surface.

Selected Publications

[1] Force calibration in lateral force microscopy - A review of the experimental methods, by M Munz. J. Phys. D: Appl. Phys. 43 (2010) 063001 (34pp)

[2] Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support, by M Munz, D C Cox, P J Cumpson. Physica Status Solidi (a) 205 (2008) 1424

If you require PDF copies of the publications, please contact us below.

Contact: Martin Munz