National Physical Laboratory

Nanoanalysis using Atomic Force Microscopy (AFM)

The atomic force microscope (AFM) is a versatile tool capable of performing analytical measurements at the nanoscale. Although AFM is commonly used for topography mapping, we are utilising its novel capabilities, such as examining nanoscale mechanical properties of surfaces, controlling the interaction forces to study soft structures, and investigating metrology parameters such as cantilever spring constant calibration, tip-shape measurement and the influence of the various AFM feedback modes on sample damage.




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