Analytical Nanoprobes
At NPL, a wide range of scanning probe microscopy techniques are available, including nanomechanical analysis, force spectroscopy, optical spectroscopy and electrochemical analysis.
This allows us to study complex systems ranging from the chemical / structural analysis of soft surfaces and bio-nano systems, to nanoparticles and their interaction with surfaces.
Areas
Scanning Ion Conductance Microscopy (SICM) is a recently developed branch of the Scanning Probe Microscopy (SPM) family.
The atomic force microscope (AFM) is a versatile tool capable of performing analytical measurements at the nanoscale.
A Photon Force Microscope (PFM) is based on an optical tweezers system, capable of manipulating nano/microparticles and measuring their interaction forces in the pico-Newton range.
The Tip-Enhanced Raman Spectrometer (TERS) or NanoRaman instrument uses a specially prepared AFM tip