Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk

1. "Linearity of the instrumental intensity scale in TOF-SIMS - a VAMAS interlaboratory study", J L S Lee, I S Gilmore, M P Seah. Surface and Interface Analysis, 44, 1-14 (2012)
2. "Synthesis of linear ZnO structures by a thermal decomposition method and their characterisation", K K Devarepally, D C Cox, A T Fry, V Stolojan, R J Curry, M Munz. Journal of Materials Science, 47(4), 1893-1901 (2012)
3. "Topography and field effects in secondary ion mass spectrometry Part II: insulating samples", J L S Lee, I S Gilmore, M P Seah, A P Levick, A G Shard . Surface and Interface Analysis, 44, 238-245 (2012)
4. "Arbitrary Self-Assembly of Peptide Extracellular Microscopic Matrices", A Bella, S Ray, M Shaw, M G. Ryadnov. Angewandte Chemie, 51, 428–431 (2012)
5. "Topography effects and monatomic ion sputtering of undulating surfaces, particles and large nanoparticles: Sputtering yields, effective sputter rates and topography evolution", M P Seah. Surface and Interface Analysis, 44, 208-218 (2012)
6. "An accurate and simple universal curve for the energy-dependent electron inelastic mean free path", M P Seah. Surface and Interface Analysis, 44, 497-503 (2012)
7. "Summary of ISO/TC 201 Standard: ISO 18115-1:2010 - surface chemical analysis - vocabulary - general terms and terms used in spectroscopy", M P Seah. Surface and Interface Analysis, 44, 618-620 (2012)
8. "Sputtering Yields of Gold Nanoparticles by C60 Ions", L Yang, M P Seah, E H Anstis, I S Gilmore, J L S Lee. Journal of Physical Chemistry C, 116, 9311-9318 (2012)
9. "Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issues", C A Clifford, M P Seah. Nanotechnology, 23, 165704 (2012)
10. "Development of a Novel Combined Scanning Electrochemical Microscope (SECM) and Scanning Ion-Conductance Microscope (SICM) Probe for Soft Sample Imaging", A J Pollard, N Faruqui, M Shaw, C A Clifford, Y Takahashi, Y E Korchev, N Ebejer, J V Macpherson, P R Unwin, D Roy. Mater. Res. Soc. Symp. Proc., 1422, 07-04 (2012)
11. "Summary of ISO/TC 201 Standard: ISO 14701:2011 – Surface chemical analysis - X-ray photoelectron spectroscopy - measurement of silicon oxide thickness", M P Seah. Surface and Interface Analysis, 44, 876-878 (2012)
12. "Summary of ISO/TC 201 Standard: ISO 18115-2:2010 - Surface chemical analysis – Vocabulary - Terms used in scanning probe microscopy", M P Seah. Surface and Interface Analysis, 44, 879-880 (2012)
13. "Surface analysis using a new plasma assisted desorption/ionisation source for mass spectrometry in ambient air", A Bowfield, D A Barrett, M R Alexander, C A Ortori, F M Rutten, T L Salter, I S Gilmore, J W Bradley. Review of Scientific Instruments , 83, 63503 (2012)
14. "Nanomechanical measurements of hair as an example of micro-fibre analysis using atomic force microscopy nanoindentation", C A Clifford, N Sano, P Doyle, M P Seah. Ultramicroscopy, 114, 38-45 (2012)
15. "The role of metrology and the UK National Physical Laboratory in nanotechnology", C Minelli, C A Clifford. Nanotechnology Perceptions, 8, 59-75 (2012)
16. "Chemical and spatial analysis of protein loaded PLGA microspheres for drug delivery applications", A Rafati, A Boussahel, K M Shakesheff, A G Shard, C J Roberts, X Chen, D J Scurr, S Rigby-Singleton, P Whiteside, M R Alexander, M C Davies. Journal of Controlled Release, 162, 321-329 (2012)
17. "Emerging Techniques for Submicrometer Particle Sizing Applied to Stöber Silica", N C Bell, C Minelli, J Tompkins, M M Stevens, A G Shard. Langmuir, 28, 10860-10872 (2012)
18. "A Straightforward Method For Interpreting XPS Data From Core-Shell Nanoparticles", A G Shard. Journal of Physical Chemistry C, 116 (31), 16806-16813 (2012)
19. "Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams", L Yang, M P Seah, I S Gilmore. Journal of Physical Chemistry C, 116 (44), 2373523741 (2012)
20. "Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogram", S Aoyagi, I S Gilmore, I Mihara, M P Seah, I W Fletcher. Rapid Communications in Mass Spectrometry, 26, 2815–2821 (2012)
21. "Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study", A G Shard, R Havelund, M P Seah, S J Spencer, I S Gilmore, N Winograd, D Mao, T Miyayama, E Niehuis, D Rading, R Moellers. Analytical Chemistry, 84, 7865-7873 (2012)
22. "Simple universal curve for the energy-dependent electron attenuation length for all materials", M P Seah. Surface and Interface Analysis, 44, 1353-1359 (2012)