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Surface & Nanoanalysis Publications

We study the measurement of the physical and chemical properties of surfaces down to the nanoscale, from biological samples to electronic components.

Publications by the Surface & Nanoanalysis Group are listed below by year. If you would like to request PDF copies, please email nanoanalysis@npl.co.uk.

2011

  1. "Cluster primary ion sputtering: correlations in secondary ion intensities in TOF-SIMS", M P Seah and I S Gilmore. Surface and Interface Analysis, 43, 228-235 (2011)
  2. "A comparison of SIMS and DESI and their complementarities", T L Salter, F M Green, P Stokes, M P Seah, I S Gilmore. Surface and Interface Analysis, 43, 294-297 (2011)
  3. "Attenuation lengths in organic materials", M P Seah, S J Spencer. Surface and Interface Analysis, 43, 744 (2011)
  4. "Linearity of the instrumental intensity scale in TOF-SIMS—a VAMAS interlaboratory study", J L S Lee, I S Gilmore, M P Seah. Surface and Interface Analysis, in press (2011)
  5. "Mass Spectrometry and Informatics: Distribution of Molecules in the PubChem Database and General Requirements for Mass Accuracy in Surface Analysis", F M Green, I S Gilmore, M P Seah. Analytical Chemistry, 83, 3239-3243 (2011)
  6. "Surface Mass Spectrometry of Two Component Drug–Polymer Systems: Novel Chromatographic Separation Method Using Gentle-Secondary Ion Mass Spectrometry (G-SIMS)", R Ogaki, I S Gilmore, M R Alexander, F M Green, M C Davies, J L S Lee. Analytical Chemistry, 83, 3627–3631 (2011)
  7. "Cluster Primary Ion Sputtering: Correlations in Secondary Ion Intensities in TOF SIMS", M P Seah and I S Gilmore. Surface and Interface Analysis, 43, 228-235 (2011)
  8. "Imaging surfaces of nano-scale roughness by atomic force microscopy with carbon nanotubes as tips: A comparative study", M Munz, J-H Kim, O Krause and D Roy. Surface and Interface Analysis, 43, 1382-1391 (2011)
  9. "Analysis of personal care products on model skin surfaces using DESI and PADI ambient mass spectrometry", T L Salter, F M Green, N Faruqui and I S Gilmore. The Analyst, 136, 3274-3280 (2011)
  10. "Topography and field effects in Secondary Ion Mass Spectrometry - Part I: Conducting Samples", J L S Lee, I S Gilmore, M P Seah and I W Fletcher. Journal of the American Society for Mass Spectrometry, 22 (10), 1718-1728 (2011)
  11. "Analysis of thin films andmolecular orientation using cluster SIMS", F M Green, M P Seah, I S Gilmore, T L Salter, S J Spencer. Surface and Interface Analysis, 43, 1224-1230 (2011)
  12. "Chapter 6 - Surface and interface characterisation ", M P Seah, L De Chiffre. Springer Handbook of Metrology and Testing, 2nd Edn, Eds H Czichos, T Saito and L Smith, 281-335 (2011)
  13. "Depth resolution and inhomogeneity of the sputtering dose with sample rotation and ion beam rastering", A G Shard, M P Seah. Surface and Interface Analysis, 43, 1430-1435 (2011)
  14. "Analytical techniques: surface and interfacial characterisation", M R Alexander, I S Gilmore. Current Opinion in Chemical Biology, 15, 664-666 (2011)
  15. "Multifunctional Nanoprobes for Nanoscale Chemical Imaging and Localized Chemical Delivery at Surfaces and Interfaces", Y. Takahashi, A. I. Shevchuk, P. Novak, Y. Zhang, N. Ebejer, J. V. Macpherson, P. R. Unwin, A. J. Pollard, D. Roy, C. A. Clifford, H. Shiku, T. Matsue, D. Klenerman, and Y. E. Korchev. Angewandte Chemie International Edition, 50, 9638-9642 (2011)
  16. "Effect of crystallisation on the electronic energy levels and thin film morphology of P3HT:PCBM blends", W C Tsoi, S J Spencer, L Yang, P Nicholoson, A Turnbull, A G Shard, C E Murphy, D D C Bradley, J Nelson, J S Kim. Macromelecules, 44, 2944-2952 (2011)
  17. "Optical properties and thermal stability of LaYbO3 ternary oxide for high-k dielectric application", W T Su, L Yang, B Li. Applied Surface Science, 257, 2526-2530 (2011)
  18. "Growth dynamics and thermal stability of Ni nanocrystalline nanowires", Z F Zhou, Y Pan, Y C Zhou, L Yang. Applied Surface Science, 257, 9991-9995 (2011)
  19. "VAMAS interlaboratory study on organic depth profiling", A G Shard, S Ray, M P Seah, L Yang. Surface and Interface Analysis, 43, 1240-1250 (2011)
  20. "VAMAS interlaboratory study on organic depth profiling. Part I: Preliminary report", A G Shard, R Foster, I S Gilmore, J L S Lee, S Ray, L Yang. Surface and Interface Analysis, 43, 510-513 (2011)
  21. "Synthesis of linear ZnO structures by a thermal decomposition method and their characterisation", K K Devarepally, D C Cox, A T Fry, V Stolojan, R J Curry, M Munz. Journal of Materials Science, in press (2011)
  22. "Energy dependence of the electron attenuation length in silicon dioxide", M P Seah and S J Spencer. Measurement Science and Technology, 22, 115602 (5 pages) (2011)
  23. "Topography and field effects in secondary ion mass spectrometry Part II: insulating samples", J L S Lee, I S Gilmore, M P Seah, A P Levick, A G Shard. Surface and Interface Analysis, in press (2011)