National Physical Laboratory

NiCE-MSI expands capacity and capability with ION-TOF TOF-SIMS.5 instrument

The TOF-SIMS.5 instrument (background) was installed in April 2016 and is now in operation alongside NPL's 19-year-older SIMS instrument

The TOF-SIMS.5 instrument (background) was
installed in April 2016 and is now in operation
alongside NPL's 19-year-older SIMS instrument

Increasing demand for high resolution surface chemical analysis and continued growth in research activities in secondary ion mass spectrometry (SIMS) have led NPL to invest in a new time-of-flight SIMS instrument. The TOF-SIMS.5 offers state-of-the-art capability for surface spectroscopy, chemical depth profiling and 3D imaging. This includes:

  • High resolution chemical imaging (80 nm) using Bi nanoprobe liquid metal ion source

  • Argon gas cluster ion source for gentle depth profiling and 3D imaging of organic materials with depth resolution down to 5 nm

  • Focused ion beam (FIB) for in situ cross-sectioning and FIB-SIMS tomography of multi-phase and porous materials

Later this year, NiCE-MSI will take delivery of the revolutionary instrument built in the 3D OrbiSIMS project. The 3D OrbiSIMS instrument, amongst other advances, incorporates the powerful Orbitrap™ mass analyser.

For more information, contact Dr Rasmus Havelund

Last Updated: 23 Nov 2016
Created: 3 May 2016

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