National Physical Laboratory

15-19 May 2017 : 79th IUVSTA Workshop: 3D Chemical Imaging – from fundamentals to advancing applications79th IUVSTA Workshop: 3D Chemical Imaging – from fundamentals to advancing applications
15 – 19 May 2017, Hotel Flamingo Resort, Santa Margherita di Pula, Sardinia, Italy

This workshop will engage leading scientists in the area of 3D chemical imaging in a lively scientific debate to address fundamentals and important challenges for 3D secondary ion mass spectrometry (SIMS), FIB-SIMS and atom probe tomography.

Scientific Programme

The workshop starts on Monday 15 May at 08:30 hrs and closes at 13:00 hrs on Friday 19 May. There will be an evening welcome reception on Sunday 14 May.

79th IUVSTA Workshop Scientific Programme

(Click here to open pdf version)


Invited Speakers

Arnaud Delcorte Université Catholique de Louvain Large clusters for 3D SIMS imaging: New physics, new opportunities and… new challenges

Thomas Kelly CAMECA Instruments Developmental Prospects for Atom Probe Tomography

Wilfried Vandervorst Imec Industrial application of atom probe tomography to semiconductor devices and manufacturing : dream or reality?
Felix Kollmer ION-TOF GmbH FIB-SIMS cross section analysis and tomography of inorganic and organic surfaces
Gregory Fisher Physical Electronics FIB-TOF Imaging & 3D Tomography: Successes and Challenges
Francois Vurpillot Université de Rouen From the quantum scale to the mesoscopic scale: The need of modelling tools in Atom Probe Tomography
Lorenzo Rigutti Université de Rouen Atom Probe Tomography of compound semiconductors: compositional accuracy and complementary Transmission Electron Microscopy
Tom Wirtz Luxembourg Institute of Science & Technology Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics
Jean-Paul Barnes CEA - LETI Correlative FIB-TOF-SIMS and x-ray nanotomography
John Fletcher University of Gothenburg Limitless fun! 3D ToF-SIMS analysis in the polyatomic and cluster age
Jiro Matsuo Kyoto University Organic Material Analysis with a SIMS System Equipped with a High-Current Gas Cluster Ion Source and Q-TOF MS/MS
Ian Gilmore National Physical Laboratory 3D imaging using the OrbiSIMS with single beam, dual beam and dual spectrometer modes

 

Exhibition and Sponsors

IUVSTA logo

The workshop is supported by the International Union for Vacuum Science, Technique and Applications

 

The Organising Committee is grateful for additional sponsorship from:

ION-TOF logo

ION-TOF
Platinum sponsor

IONOPTIKA logo   FEI logo

IONOPTIKA
Gold sponsor

 

FEI (part of ThermoFisher Scientific)
Gold sponsor


For sponsorship enquiries, please contact iuvsta79@npl.co.uk

Registration

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