Surface characterisation on the nanoscale
NPL offers a range of tools to study the structure and physico-chemical properties of nanopatterned surfaces or self-assembled layers on surfaces:
- 3D and confocal optical microscopy
- Scanning electron microscopy
- Atomic force microscopy
Dynamic Contact Angle Analysis
Contact Angle analysis can be used to characterise surface treatment, cleanliness, and purity. This system can also be used in parallel with atomic force microscopy to investigate adhesion properties and the wetting properties of plastics, glass or metal.
Contact
Customer Service tel: +44 20 8943 8681
E-mail: materials_enquiries@npl.co.uk

