National Physical Laboratory

Surface characterisation on the nanoscale

Micro-structured patterned waferA micro-structured patterned wafer
showing its hydrophobicity
- droplet of deionised water 

NPL offers a range of tools to study the structure and physico-chemical properties of nanopatterned surfaces or self-assembled layers on surfaces:

  • 3D and confocal optical microscopy

  • Scanning electron microscopy

  • Atomic force microscopy

Dynamic Contact Angle Analysis

Contact Angle analysis can be used to characterise surface treatment, cleanliness, and purity. This system can also be used in parallel with atomic force microscopy to investigate adhesion properties and the wetting properties of plastics, glass or metal.

Contact

Customer Service tel: +44 20 8943 8681
E-mail: materials_enquiries@npl.co.uk

Last Updated: 25 Mar 2010
Created: 27 Jul 2009

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