National Physical Laboratory

Scanning Probe Metrology (SPM)

Current-AFM measurement on Carbon NanotubesCurrent-AFM measurement on Carbon Nanotubes 

SPM techniques can be used to image surface properties with sub-nanometre resolution. Some of the material characteristics that can be studied using such methods include mechanical, topography, magnetic, electrical, thermal, adhesion strength, and many others. NPL can offer these techniques in ambient air (with variable temperature and humidity) or in Ultra High Vacuum (UHV).


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Last Updated: 25 Mar 2010
Created: 27 Jul 2009


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