Scanning Electron Microscopy and Chemical Analysis

The Scanning Electron Microscopy facility is equipped with a range of instruments for obtaining high-resolution images and for the chemical analysis of materials.

Facilities

Camscan MX2500 conventional tungsten filament SEM used primarily for chemical microanalysis.

• Oxford Instrument INCA energy dispersive specrometer for analysis of materials with atomic number Z≥ 11
• Oxford Instrument INCA WAVE wavelength dispersive spectrometer for analysis of materials with atomic number Z≥ 5
  KE four quadrant electron back scattered detector for atomic number contrast
• Secondary Electron Imaging
• Incorporates a relatively large specimen chamber allowing examination of large objects

The laboratory is accredited to ISO 17025 for imaging and quantitative microanalysis using the EDX system, and has the experience of microanalysis of a wide range of materials.

Zeiss Supra 40 Field Emission SEM for high resolution imaging at the nanometre scale.

• TSL Hikari electron backscatter diffraction system
• Oxford Instrument HKL electron backscatter diffraction system
• Oxford Instrument INCA energy dispersive spectrometer
• KE STEM and four quadrant electron back scattered detector
• Secondary Electron Imaging

This instrument is primarily used for high resolution imaging and measurement of orientation by EBSD and its application.. Examples of the work include grain size by EBSD; crystallographic studies and research into the effects of strain.

NPL is an active member of the International Standards organisation TC202 on microbeam analysis.

Contact

Customer Service tel: +44 20 8943 8681
E-mail: materials_enquiries@npl.co.uk