National Physical Laboratory

X-Ray Florescence (XRF)

X-Ray Florescence (XRF)
XRF used to detect conformal coating thickness

XRF florescence can be used to determine the atomic content of a material. X-rays are used to knock out electrons from the shells of target atoms. As electrons fall back into the gaps, they release x-rays at characteristic energies for each element. Analysis of this x-ray florescence will reveal the relative content of the elements detected.

XRF can be used to screen for the presence of trace elements such as for lead in electronic components by looking for the characteristic peak of lead in the energy spectrum.

XRF can also be used for thickness measurement of layered composites if the content of each layer is known.

Common Applications:

  • Screening for ROHS compliance

  • Thickness measurements

  • Validation of solder content

Contact

Customer Service tel: +44 20 8943 8681
E-mail: materials_enquiries@npl.co.uk

Last Updated: 11 Aug 2015
Created: 8 Feb 2010

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